Refreshing the IEEE 1687 IJTAG family for today's designs
Refreshing the IEEE 1687 IJTAG family for today's designs,Spark range data reduction using a Gauss collocation method - Bradley T Burchett, 2023,Ta2O5/SiO2 Multicomponent Dielectrics for Amorphous Oxide TFTs,ANSI / IEEE Standards C37 & UL 489,ScanWorks IJTAG Test | ASSET InterTech